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Characterization of semiconductor he...
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Lamberti, Carlo.
Characterization of semiconductor heterostructures and nanostructures
紀錄類型:
書目-語言資料,印刷品 : 單行本
其他作者:
LambertiCarlo.,
其他團體作者:
ScienceDirect (Online service)
出版地:
Amsterdam
出版者:
Elsevier;
出版年:
2008.
版本:
1st ed.
面頁冊數:
ix, 486 p., [3] p. of platesill. (some col.) : 25 cm.;
標題:
Heterostructures. -
標題:
Nanostructures. -
標題:
Semiconductors. -
標題:
Electronic books. -
電子資源:
http://www.sciencedirect.com/science/book/9780444530998
附註:
Electronic reproduction. Amsterdam : Elsevier Science & Technology, 2008.
ISBN:
0444530991
內容註:
Chapter 1. Introduction (C. Lamberti) Chapter 2. Ab-initio studies of structural and electronic properties (M. Peressi, A. Baldereschi and S. Baroni) Chapter 3. Electrical and optical properties of heterostructures (TBC) Chapter 4. Strain and composition determination in semiconducting heterostructures by high resolution X-ray diffraction (C. Ferrari and C. Bocchi) Chapter 5. Transmission Electron Microscopy techniques for imaging and composition evaluation in Semiconductor Heterostructures (L. Lazzarini, L. Nasi and V. Grillo) Chapter 6. Accessing structural and electronic properties of semiconductor nanostructures via photoluminescence (S. Sanguinetti, M. Guzzi and M. Gurioli) Chapter 7. Power dependent cathodoluminescence in III-Nitrides heterostructures: from internal field screening to controlled band gap modulation (G. Salviati, L. Lazzarini, N. Armani, F. Rossi and V. Grillo) Chapter 8. Raman Spectroscopy (D. Wolverson) Chapter 9. X-ray absorption fine structure spectroscopy (F. Boscherini) Chapter 10. Nanostructures in the light of synchrotron radiation: surface sensitive x-ray techniques and anomalous scattering (T. Metzger, J. Eymery, V. Favre-Nicolin, G. Renaud, H. Renevier and T. Schulli) Chapter 11. Grazing Incidence Diffraction Anomalous Fine Structure to study the structural properties of semiconductor nanostructures (M. Grazia Proietti, J. Coraux and H. Renevier) Chapter 12. The Role of Photoemission Spectroscopies in Heterojunction Research (G. Margaritondo) Chapter 13. EPR of interfaces and nanolayers in semiconductor heterostructures (A. Stesmans and V.V. Afans'ev).
Characterization of semiconductor heterostructures and nanostructures
Characterization of semiconductor heterostructures and nanostructures
/ edited by Carlo Lamberti. - 1st ed.. - Amsterdam : Elsevier, 2008.. - ix, 486 p., [3] p. of plates ; ill. (some col.) ; 25 cm..
Chapter 1. Introduction (C. Lamberti).
Electronic reproduction. Amsterdam : Elsevier Science & Technology, 2008..
Includes bibliographical references and index..
ISBN 0444530991ISBN 9780444530998
Heterostructures.Nanostructures.Semiconductors.Electronic books.
Lamberti, Carlo.
Characterization of semiconductor heterostructures and nanostructures
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Chapter 1. Introduction (C. Lamberti)
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Chapter 2. Ab-initio studies of structural and electronic properties (M. Peressi, A. Baldereschi and S. Baroni)
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Chapter 3. Electrical and optical properties of heterostructures (TBC)
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Chapter 4. Strain and composition determination in semiconducting heterostructures by high resolution X-ray diffraction (C. Ferrari and C. Bocchi)
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Chapter 5. Transmission Electron Microscopy techniques for imaging and composition evaluation in Semiconductor Heterostructures (L. Lazzarini, L. Nasi and V. Grillo)
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Chapter 6. Accessing structural and electronic properties of semiconductor nanostructures via photoluminescence (S. Sanguinetti, M. Guzzi and M. Gurioli)
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Chapter 7. Power dependent cathodoluminescence in III-Nitrides heterostructures: from internal field screening to controlled band gap modulation (G. Salviati, L. Lazzarini, N. Armani, F. Rossi and V. Grillo)
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Chapter 8. Raman Spectroscopy (D. Wolverson)
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Chapter 9. X-ray absorption fine structure spectroscopy (F. Boscherini)
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Chapter 10. Nanostructures in the light of synchrotron radiation: surface sensitive x-ray techniques and anomalous scattering (T. Metzger, J. Eymery, V. Favre-Nicolin, G. Renaud, H. Renevier and T. Schulli)
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Chapter 11. Grazing Incidence Diffraction Anomalous Fine Structure to study the structural properties of semiconductor nanostructures (M. Grazia Proietti, J. Coraux and H. Renevier)
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Chapter 12. The Role of Photoemission Spectroscopies in Heterojunction Research (G. Margaritondo)
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Chapter 13. EPR of interfaces and nanolayers in semiconductor heterostructures (A. Stesmans and V.V. Afans'ev).
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An electronic book accessible through the World Wide Web; click for information
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